L_TT1P_CrossCutterState, L_TT1P_RegisterControlState: Error with mark referencing in clutched-in state (eliminated from V3.17.0)
Eliminated from: Library: L_TT1P_TechnologyModules_LM from V03.17.0.47 (Update via Easy Package Manager)
Behavoiur of new version:
Teaching the mark window in the coupled state resets the internal position of the mark window. The internal position is integrated with the speed of the conductance and opens half a mark window width before the next zero crossing of the register clock. Thus, the mark window function is independent of the register position.
What happens?
In clutched-in state, mark window teaching does not work correctly. If mark window teaching is executed in clutched-in state, the mark window is set to the position detected in the register cycle. The determined offset from the parameterised sensor position also has an effect on the cutting position.
When does this behaviour occur?
The mark position (touch probe window) is referenced in clutched-in state (xTeachMarkWindow).
Which products are affected? L_TT1P_CrossCutterState in the L_TT1P_TechnologyModules_LM library (V3.15.0.32 and higher)
L_TT1P_RegisterControlState in the L_TT1P_TechnologyModules_LM library (V3.15.0.32 and higher)
Short-term measures:
Only execute mark window teaching in declutched state.
Evaluation/recommendations:
Behaviour in clutched-in state: When a touch probe mark has been detected, the touch probe window is adjusted to the position of the detected mark and activated.
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